Investigation of the interfaces in schottky diodes using equivalent circuit models

ACS Applied Materials and Interfaces

Volumn 5, Issue 15, 2013, Pages 6951-6958

  Yim, Chanyoung ^a   McEvoy, Niall ^a   Kim, Hye Young ^a   Rezvani, Ehsan ^a   Duesberg, Georg S ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

conductive carbon thin films; equivalent circuit model; impedance spectroscopy; interface analysis; metal semiconductor contact; Schottky diode

Indexed keywords

CONDUCTIVE CARBON; EQUIVALENT CIRCUIT MODEL; IMPEDANCE SPECTROSCOPY; INTERFACE ANALYSIS; METAL-SEMICONDUCTOR CONTACTS; SCHOTTKY DIODES;

CARBON; CIRCUIT SIMULATION; CIRCUIT THEORY; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; METALS; SCHOTTKY BARRIER DIODES; SILICON; SPECTROSCOPY; THIN FILMS;

METAL ANALYSIS;

EID: 84882773230     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am400963x     Document Type: Article

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