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Volumn 3, Issue 8, 2013, Pages 1068-1074

Improved black silicon for photovoltaic applications

(7) Algasinger, Michael a Paye, Julie a Werner, Florian b Schmidt, Jan b Brandt, Martin S a Stutzmann, Martin a Koynov, Svetoslav a

a WALTER SCHOTTKY INSTITUT (Germany)

b INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH (Germany)

Author keywords

nanostructures; semiconductors; solar cells; surface modification

Indexed keywords

CROSS-SECTIONAL SCANNING ELECTRON MICROSCOPIES; ELECTRICALLY DETECTED MAGNETIC RESONANCES; ELECTRON SPIN RESONANCE MEASUREMENTS; OPTICAL REFLECTIVITY; PARAMAGNETIC DEFECTS; PHOTOVOLTAIC APPLICATIONS; SOLAR-CELL APPLICATIONS; WET CHEMICAL TREATMENT;

ATOMIC LAYER DEPOSITION; CATALYSIS; ELECTRONIC PROPERTIES; MAGNETIC RESONANCE SPECTROSCOPY; MORPHOLOGY; NANOSTRUCTURES; PASSIVATION; POROUS SILICON; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON; SOLAR CELLS; SURFACE TREATMENT; TEXTURES; WET ETCHING;

SILICON WAFERS;

EID: 84882264487 PISSN: 16146832 EISSN: 16146840 Source Type: Journal
DOI: 10.1002/aenm.201201038 Document Type: Article

Times cited : (53)

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