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Journal of Applied Physics

Volumn 110, Issue 4, 2011, Pages

Black thin film silicon

(3) Koynov, Svetoslav a Brandt, Martin S a Stutzmann, Martin a

a WALTER SCHOTTKY INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BLACK SILICON; EFFECTIVE MEDIUM; LIGHT PATH; LIGHT-TRAPPING; MICROCRYSTALLINE SILICON THIN FILMS; NANO SCALE; OPTICAL EFFECTS; PHOTOCONDUCTIVITY SPECTRUM; PHOTOMETRIC MEASUREMENTS; PHOTOTHERMAL DEFLECTION SPECTROSCOPY; PHOTOVOLTAICS; SILICON SURFACES; SPECTRAL RANGE; THIN FILM SILICON;

ABSORPTION; ABSORPTION SPECTROSCOPY; AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; ETCHING; MICROCRYSTALLINE SILICON; OPTICAL CORRELATION; REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; THICK FILMS; THIN FILMS;

AMORPHOUS SILICON;

EID: 80052426029 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3626900 Document Type: Article

Times cited : (20)

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