Preferred orientation of Cu(In,Ga)Se2 thin film deposited on stainless steel substrate

Progress in Photovoltaics: Research and Applications

Volumn 21, Issue 5, 2013, Pages 838-848

  Li, Bo Yan ^a   Zhang, Yi ^a   Wang, He ^a   Wang, Biao ^a   Wu, Li ^a   Sun, Yun ^a  

^a NANKAI UNIVERSITY   (China)

Author keywords

CIGS thin film; Fe diffusion; preferred orientation

Indexed keywords

CIGS THIN FILMS; FE DIFFUSION; GRAZING INCIDENCE X-RAY DIFFRACTION; ION MASS SPECTROSCOPY; PREFERRED ORIENTATIONS; PROCESS PARAMETERS; STAINLESS STEEL SUBSTRATES; SUBSTRATE TEMPERATURE;

COPPER; GALLIUM; GALLIUM ALLOYS; MASS SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; TEXTURES; THIN FILMS; X RAY DIFFRACTION;

SUBSTRATES;

EID: 84881227866     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2164     Document Type: Article

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