Crystallographic growth orientation of Cu(InGa)Se 2 films in relation to substrate material nature

Physica Status Solidi (A) Applications and Materials Science

Volumn 203, Issue 11, 2006, Pages 2639-2643

  Yamada, A ^a   Matsubara, K ^a   Nakamura, S ^b   Ishizuka, S ^a   Sakurai, K ^a   Tampo, H ^a   Shibata, H ^a   Nakanishi, H ^b   Niki, S ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC LATTICES; LATTICE PLANE; POLE FIGURE MEASUREMENTS; TEXTURE ANALYSIS;

CRYSTAL GROWTH; CRYSTAL LATTICES; CRYSTAL ORIENTATION; EVAPORATION; SPUTTERING; X RAY DIFFRACTION;

THIN FILMS;

EID: 33748998179     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200669581     Document Type: Article

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