Effect of copper content on optostructural, morphological and photoelectrochemical properties of MoBi2-x Cu x Se 4 thin films

Journal of Materials Science

Volumn 48, Issue 20, 2013, Pages 7300-7311

  Kharade, Suvarta D ^a   Pawar, Nita B ^a   Mali, Sawanta S ^a,b   Hong, Chang K ^b   Patil, Pramod S ^a,b   Gang, Myeng Gil ^b   Kim, Jin Hyeok ^b   Bhosale, Popatrao N ^a  

^a SHIVAJI UNIVERSITY   (India)

^b Chonnam National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITIONAL ANALYSIS; ELECTRICAL CONDUCTIVITY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; ORTHORHOMBIC CRYSTAL STRUCTURES; PHOTOELECTROCHEMICAL PROPERTIES; PHOTOELECTROCHEMICAL RESPONSE; PRECIPITATION TECHNIQUES; TRANSMISSION ELECTRON MICROSCOPY IMAGES;

CADMIUM SULFIDE SOLAR CELLS; COPPER; DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84881173003     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-013-7550-z     Document Type: Article

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