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Volumn 9, Issue 32, 2013, Pages 7797-7803
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Surface wrinkling by chemical modification of poly(dimethylsiloxane)-based networks during sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFERENTIAL THERMAL EXPANSION;
EXPERIMENTAL EVIDENCE;
POLYDIMETHYLSILOXANE NETWORKS;
POLYMERIC SUBSTRATE;
RADIO FREQUENCY PLASMA;
SPUTTERING PRESSURES;
THERMO-MECHANICAL STRESS;
WRINKLE FORMATION;
CHEMICAL MODIFICATION;
KINETICS;
MICROCHANNELS;
PHOTOELECTRONS;
POLYMERIC FILMS;
THERMAL EXPANSION;
TOPOGRAPHY;
X RAY PHOTOELECTRON SPECTROSCOPY;
SURFACE TOPOGRAPHY;
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EID: 84880857874
PISSN: 1744683X
EISSN: 17446848
Source Type: Journal
DOI: 10.1039/c3sm50966d Document Type: Article |
Times cited : (31)
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References (39)
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