Substrate thickness: An effective control parameter for polymer thin film buckling on PDMS substrates

Journal of Applied Polymer Science

Volumn 112, Issue 5, 2009, Pages 2683-2690

  Hyun, Dong Choon ^a   Jeong, Unyong ^a  

^a Yonsei University   (South Korea)

Author keywords

Buckling; Polymer patterning; Polymer thin films

Indexed keywords

BUCKLING PATTERNS; CONTROL PARAMETERS; CROSSLINKED; PDMS SUBSTRATES; POLYDIMETHYLSILOXANE PDMS; POLYMER THIN FILMS; SUBSTRATE THICKNESS;

BUCKLING; CONTROL SYSTEM ANALYSIS; MICROCHANNELS; PLASTIC FILMS; POLYMER FILMS; POLYMERS; SILICONES; THIN FILMS;

SUBSTRATES;

CROSS LINKING; CROSS LINKING AGENT; FILM; PLASMA TREATMENT; POLYDIMETHYLSILOXANE; POLYMER;

EID: 64249083590     PISSN: 00218995     EISSN: 10974628     Source Type: Journal    
DOI: 10.1002/app.29824     Document Type: Article

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