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Volumn 21, Issue 14, 2013, Pages 17340-17351

X-ray phase contrast imaging and noise evaluation using a single phase grating interferometer

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INTERFEROMETERS;

EID: 84880553014     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.017340     Document Type: Article
Times cited : (40)

References (47)
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