Observation of the Talbot effect using broadband hard X-ray beam

Optics Express

Volumn 18, Issue 24, 2010, Pages 24975-24982

  Kim, Jae Myung ^a   Cho, In Hwa ^a   Lee, Su Yong ^a   Kang, Hyon Chol ^b   Conley, Ray ^c   Liu, Chian ^d   Macrander, Albert T ^d   Noh, Do Young ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

^b Chosun University   (South Korea)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTORESISTS;

HARD X-RAY BEAMS; MICROMETER SCALE; PHASE REVERSAL; SIMULATED RESULTS; TALBOT DISTANCE; TALBOT EFFECTS; X RAY BEAM;

X RAYS;

EID: 78649702387     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.024975     Document Type: Article

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