X-ray interferometer with bent gratings: Towards larger fields of view

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 648, Issue SUPPL. 1, 2011, Pages

  Revol, Vincent ^a,b   Kottler, Christian ^a   Kaufmann, Rolf ^a   Jerjen, Iwan ^c   Lüthi, Thomas ^c   Cardot, Francis ^a   Niedermann, Philippe ^a   Straumann, Ulrich ^b   Sennhauser, Urs ^c   Urban, Claus ^a  

^a CSEM   (Switzerland)

^b PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

^c SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Gratings interferometer; Phase contrast imaging; X ray imaging

Indexed keywords

ANGULAR INCIDENCE; DARK FIELD IMAGING; FIELD OF VIEWS; FIELDS OF VIEWS; FUNDAMENTAL LIMITATIONS; HARD X RAY; HIGH RESOLUTION; INDUSTRIAL SYSTEMS; LARGE OBJECTS; LARGER FIELDS; PHASE CHANGE; PHASE CONTRASTS; PHASE SENSITIVE IMAGING; PHASE-CONTRAST IMAGING; SIGNIFICANT IMPACTS; TALBOT-LAU INTERFEROMETER; THEORETICAL LIMITS; X-RAY INTERFEROMETERS; XRAY IMAGING;

X RAY ANALYSIS; X RAYS;

INTERFEROMETERS;

EID: 79960837770     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.11.040     Document Type: Article

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