Quadriwave lateral shearing interferometry in an achromatic and continuously self-imaging regime for future X-ray phase imaging

Optics Letters

Volumn 36, Issue 8, 2011, Pages 1398-1400

  Rizzi, Julien ^a   Weitkamp, Timm ^b   Guérineau, Nicolas ^a   Idir, Mourad ^c   Mercère, Pascal ^a   Druart, Guillaume ^b   Vincent, Grégory ^a   Da Silva, Paulo ^b   Primot, Jérôme ^a  

^a ONERA   (France)

^b SYNCHROTRON SOLEIL   (France)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HARD X RAY; INTERFEROGRAMS; LATERAL SHEARING INTERFEROMETER; LATERAL SHEARING INTERFEROMETRY; SELF IMAGING; SYNCHROTRON BEAMLINES; X-RAY PHASE IMAGING;

INTERFEROMETRY; X RAYS;

SHEARING;

EID: 79956257727     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.001398     Document Type: Article

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