Interfacial micropore defect formation in PEDOT:PSS-Si hybrid solar cells probed by TOF-SIMS 3D chemical imaging

Analytical Chemistry

Volumn 85, Issue 14, 2013, Pages 6840-6845

  Thomas, Joseph P ^a   Zhao, Liyan ^a   Abd Ellah, Marwa ^a   Heinig, Nina F ^a   Leung, K T ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL IMAGING; CLUSTER ION SPUTTERING; DEVICE PARAMETERS; HYBRID SOLAR CELLS; INTERFACE REGIONS; NATIVE OXIDE LAYER; STRUCTURAL DAMAGES; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

CONDUCTING POLYMERS; DEFECTS; ETHYLENE; INTERFACES (MATERIALS); MICROPOROSITY; SECONDARY ION MASS SPECTROMETRY; SILICON; THREE DIMENSIONAL;

SOLAR CELLS;

EID: 84880534155     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac401084x     Document Type: Article

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