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Applied Physics Letters

Volumn 103, Issue 2, 2013, Pages

Interfacial trapping for hot electron injection in silicon

(7) Lu, Y a Lacour, D a Lengaigne, G a Le Gall, S a Suire, S a Montaigne, F a Hehn, M a

a INSTITUT JEAN LAMOUR (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIPARALLEL STATE; COLLECTOR CURRENTS; ELECTRON TRAPPING; INTERFACIAL CHARGE; MAGNETIC TUNNEL TRANSISTORS; TRANSPORT MEASUREMENTS; TRAPPED ELECTRONS; TUNNELING BARRIER;

BINDING ENERGY; ELECTRON INJECTION; ELECTRON TUBES; SILICON;

HOT ELECTRONS;

EID: 84880475078 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4813015 Document Type: Article

Times cited : (8)

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