Pattern recognition for bivariate process mean shifts using feature-based artificial neural network

International Journal of Advanced Manufacturing Technology

Volumn 66, Issue 9-12, 2013, Pages 1201-1218

  Masood, Ibrahim ^a   Hassan, Adnan ^b  

^a UNIVERSITI TUN HUSSEIN ONN MALAYSIA   (Malaysia)

^b UNIVERSITI TEKNOLOGI MALAYSIA   (Malaysia)

Author keywords

Artificial neural networks; Bivariate correlated patterns; Pattern recognition; Process monitoring and diagnosis; Statistical features

Indexed keywords

BIVARIATE; MONITORING AND DIAGNOSIS; MONITORING CAPABILITIES; MULTIVARIATE QUALITY CONTROL; MULTIVARIATE STATISTICAL PROCESS CONTROL; PROCESS MEAN SHIFTS; STATISTICAL FEATURES; TERM OF REFERENCES;

NEURAL NETWORKS; PATTERN RECOGNITION; PROCESS MONITORING; STABILITY CRITERIA; STATISTICAL PROCESS CONTROL;

VECTOR QUANTIZATION;

EID: 84879083117     PISSN: 02683768     EISSN: 14333015     Source Type: Journal    
DOI: 10.1007/s00170-012-4399-2     Document Type: Article

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