Improved SPC chart pattern recognition using statistical features

International Journal of Production Research

Volumn 41, Issue 7, 2003, Pages 1587-1603

  Hassan, A ^a   Shariff Nabi Baksh, M ^a   Shaharoun, A M ^a   Jamaluddin, H ^a  

^a UNIVERSITI TEKNOLOGI MALAYSIA   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; DATABASE SYSTEMS; FEATURE EXTRACTION; LEAST SQUARES APPROXIMATIONS; NEURAL NETWORKS; PRODUCTION CONTROL;

BAR CHARTS;

STATISTICAL PROCESS CONTROL;

EID: 0242333136     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/0020754021000049844     Document Type: Article

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