Simultaneous process mean and variance monitoring using artificial neural networks

Computers and Industrial Engineering

Volumn 58, Issue 4, 2010, Pages 739-753

  Guh, Ruey Shiang ^a  

^a NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

Artificial neural networks; Control charts; Feature extraction; Pattern recognition; Statistical process control

Indexed keywords

ARTIFICIAL NEURAL NETWORK; ARTIFICIAL NEURAL NETWORKS; ASSIGNABLE CAUSE; CONTROL CHART PATTERN; CONTROL CHARTS; EMPIRICAL COMPARISON; EXTENSIVE SIMULATIONS; IN-CONTROL; MONITORING SYSTEM; MOVING RANGE; NUMERICAL RESULTS; PROCESS KNOWLEDGE; PROCESS MEAN; RECOGNITION MODELS; STATISTICAL FEATURES; VARIANCE CONTROL; VARIANCE SHIFTS;

FEATURE EXTRACTION; FLOWCHARTING; GRAPHIC METHODS; MONITORING; NEURAL NETWORKS; NUMERICAL ANALYSIS; QUALITY CONTROL;

STATISTICAL PROCESS CONTROL;

EID: 77950593813     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2010.02.004     Document Type: Article

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