Issues in development of artificial neural network-based control chart pattern recognition schemes

European Journal of Scientific Research

Volumn 39, Issue 3, 2010, Pages 336-355

  Masood, Ibrahim ^a   Hassan, Adnan ^b  

^a UNIVERSITI TUN HUSSEIN ONN MALAYSIA   (Malaysia)

^b UNIVERSITI TEKNOLOGI MALAYSIA   (Malaysia)

Author keywords

Artificial neural network; Control chart pattern recognition; Feature based; Modular and integrated recognizers; Multivariate process monitoring and diagnosis; Wavelet denoise

Indexed keywords

EID: 79960001855     PISSN: 1450216X     EISSN: 1450202X     Source Type: Journal    
DOI: None     Document Type: Article

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