Effect of reannealing temperature on characteristics of nanocrystalline Sn-doped In2O3 thin films for organic photovoltaic cell applications

Applied Optics

Volumn 52, Issue 15, 2013, Pages 3444-3450

  Modayemzadeh, Hamed Reza ^a   Varnamkhasti, Mohsen Ghasemi ^b   Zabolian, Hosein ^a  

^a UNIVERSITY OF ISFAHAN   (Iran)

^b SHAHREKORD UNIVERSITY   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAIN SIZE AND SHAPE; NANOCRYSTALS; OPTICAL PROPERTIES; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; REFRACTIVE INDEX; THIN FILMS; TIN; TIN OXIDES; X RAY DIFFRACTION;

ATOMIC FORCE MICROSCOPE IMAGES; AVERAGE GRAIN SIZE; ELECTRON BEAM EVAPORATION; ORGANIC PHOTOVOLTAIC CELLS; POWER CONVERSION EFFICIENCIES; ROOT MEAN SQUARE ROUGHNESS; TRANSPARENT ELECTRODE; VISIBLE WAVELENGTHS;

OPTICAL FILMS;

EID: 84878462509     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.52.003444     Document Type: Article

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