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Volumn 519, Issue 3, 2010, Pages 1082-1086
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Growth and characterization of transparent conducting nanostructured zinc indium oxide thin films
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Author keywords
AFM; Annealing; Flash evaporation; Optical band gap; XPS; XRF; ZIO thin film
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Indexed keywords
AFM;
FLASH EVAPORATION;
XPS;
XRF;
ZIO THIN FILM;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CONDUCTIVE FILMS;
ELECTRODES;
ENERGY GAP;
EVAPORATION;
FLAT PANEL DISPLAYS;
FLEXIBLE DISPLAYS;
INDIUM;
OPTICAL BAND GAPS;
OPTOELECTRONIC DEVICES;
OXIDE FILMS;
SUBSTRATES;
THIN FILMS;
TIN;
TITANIUM COMPOUNDS;
VAPOR DEPOSITION;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC;
ZINC OXIDE;
OPTICAL FILMS;
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EID: 78049245839
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2010.08.048 Document Type: Conference Paper |
Times cited : (14)
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References (27)
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