메뉴 건너뛰기




Volumn 519, Issue 3, 2010, Pages 1082-1086

Growth and characterization of transparent conducting nanostructured zinc indium oxide thin films

Author keywords

AFM; Annealing; Flash evaporation; Optical band gap; XPS; XRF; ZIO thin film

Indexed keywords

AFM; FLASH EVAPORATION; XPS; XRF; ZIO THIN FILM;

EID: 78049245839     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.08.048     Document Type: Conference Paper
Times cited : (14)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.