Corrosion of silicon integrated circuits and lifetime predictions in implantable electronic devices

Journal of Neural Engineering

Volumn 10, Issue 3, 2013, Pages

  Vanhoestenberghe, A ^a   Donaldson, N ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION FACTORS; IMPLANTABLE ELECTRONIC DEVICES; IMPLANTED ELECTRONICS; INTEGRATED CIRCUITS (ICS); LIFETIME PREDICTION; MINIMUM SENSITIVITIES; SILICON INTEGRATED CIRCUITS; TECHNOLOGICAL ADVANCES;

IMPLANTS (SURGICAL); INTEGRATED CIRCUITS; TESTING;

CORROSION;

ALUMINUM; POLYMER; SILICON;

ACCELERATION; CORROSION; DENSITY; DEVICES; ELECTRONICS; ENCAPSULATION; HUMIDITY; IMPLANTABLE ELECTRONIC DEVICE; IMPLANTATION; INTEGRATED CIRCUIT; POLYMERIZATION; PREDICTION; PRIORITY JOURNAL; REVIEW; TEMPERATURE;

COATED MATERIALS, BIOCOMPATIBLE; CORROSION; ELECTRONICS, MEDICAL; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; PROSTHESES AND IMPLANTS; SEMICONDUCTORS; SILICON;

EID: 84878310575     PISSN: 17412560     EISSN: 17412552     Source Type: Journal    
DOI: 10.1088/1741-2560/10/3/031002     Document Type: Review

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