Growth and low-energy electron microscopy characterization of monolayer hexagonal boron nitride on epitaxial cobalt

Nano Research

Volumn 6, Issue 5, 2013, Pages 335-347

  Orofeo, Carlo M ^a   Suzuki, Satoru ^a   Kageshima, Hiroyuki ^a   Hibino, Hiroki ^a  

^a NTT Basic Research Laboratories   (Japan)

Author keywords

chemical vapor deposition; cobalt; domain boundaries; hexagonal boron nitride; low energy electron; microscopy (LEEM)

Indexed keywords

EID: 84877833849     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-013-0310-1     Document Type: Article

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