Pretest Gap mura on TFT LCDs using the optical interference pattern sensing method and neural network classification

IEEE Transactions on Industrial Electronics

Volumn 60, Issue 9, 2013, Pages 3976-3982

  Li, Tung Yen ^a   Tsai, Jang Zern ^a   Chang, Rong Seng ^a   Ho, Li Wei ^b   Yang, Ching Fu ^a  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^b HY Neural Technologies Ltd   (Taiwan)

Author keywords

Image process; interference; mura; neural network; thin film transistor (TFT) liquid crystal (LC) display (LCD) (TFT LCD)

Indexed keywords

DEFECTS; IMAGE PROCESSING; INSPECTION; LIGHT INTERFERENCE; LIQUID CRYSTAL DISPLAYS; LIQUID CRYSTALS; MEAN SQUARE ERROR; NEURAL NETWORKS; WAVE INTERFERENCE;

AUTOMATIC DEFECT INSPECTION; HUMAN VISUAL INSPECTION; IMAGE PROCESS; MURA; NEURAL NETWORK CLASSIFICATION; OPTICAL INTERFERENCE PATTERN; PRODUCT QUALITY CONTROL; THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAYS;

THIN FILM TRANSISTORS;

EID: 84877738789     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2012.2207658     Document Type: Article

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