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Volumn 2005, Issue , 2005, Pages 933-944

An intelligent defect inspection technique for color filter

Author keywords

[No Author keywords available]

Indexed keywords

COLOR IMAGE PROCESSING; ERROR DETECTION; FUZZY SETS; INFERENCE ENGINES; INSPECTION; LIQUID CRYSTAL DISPLAYS; PATTERN RECOGNITION;

EID: 33748890861     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMECH.2005.1529388     Document Type: Conference Paper
Times cited : (11)

References (9)
  • 4
    • 0026246210 scopus 로고
    • Color indexing
    • Swain MJ, Ballard DH, (1991), "Color indexing." IJCV, 7:11-32.
    • (1991) IJCV , vol.7 , pp. 11-32
    • Swain, M.J.1    Ballard, D.H.2
  • 7
    • 0032297731 scopus 로고    scopus 로고
    • Using discriminate function and counting mask operation for counting spacers in liquid crystals display plate
    • Chem Sheng Lin, Her-Chang Pu,Chiao-Hsiang Chen, Der-Chin Chen, (1998),"Using discriminate function and counting mask operation for counting spacers in liquid crystals display plate", Optic, vol.108 (3) pp.133-139.
    • (1998) Optic , vol.108 , Issue.3 , pp. 133-139
    • Lin, C.S.1    Pu, H.-C.2    Chen, C.-H.3    Chen, D.-C.4
  • 8
    • 0037969722 scopus 로고    scopus 로고
    • The preprocessing and recognition methods of an integrated automated production lot number inspection system
    • Chem-Sheng Lin, Yun-Long Lay, Chia-Chin Huan, Hsing-Cneng Chang, Thong-Shing Hwang, (2003), "The preprocessing and recognition methods of an integrated automated production lot number inspection system". Journal of Scientific & Industrial Research (JSIR), Vol.62, 573-582,
    • (2003) Journal of Scientific & Industrial Research (JSIR) , vol.62 , pp. 573-582
    • Lin, C.-S.1    Lay, Y.-L.2    Huan, C.-C.3    Chang, H.-C.4    Hwang, T.-S.5
  • 9
    • 0003109453 scopus 로고
    • In-process inspection technique for active-matrix LCD panels
    • Takashi Kido, (1992), "in-process inspection technique for active-matrix LCD panels", International Test Conference, 795-799.
    • (1992) International Test Conference , pp. 795-799
    • Kido, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.