Automated detection of color non-uniformity defects in TFT-LCD

IEEE International Conference on Neural Networks - Conference Proceedings

Volumn , Issue , 2006, Pages 1405-1412

  Lin, Hong Dar ^a   Chien, Chih Hao ^a  

^a CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE RAY TUBES; COMPUTER VISION; ENERGY EFFICIENCY; LIQUID CRYSTAL DISPLAYS; MULTIVARIABLE SYSTEMS; POINT DEFECTS;

MURA-TYPE DEFECTS; NON-UNIFORMITY REGIONS; SCREEN FLAW POINTS; VISUAL INSPECTION;

THIN FILM TRANSISTORS;

EID: 40649109582     PISSN: 10987576     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

1. K. Nakashima, "Hybrid inspection system for LCD color filter panels", Instrumentation and Measurement Technology Conference, IMTC/94. Advanced Technologies in I & M., 1994 IEEE, Vol. 2, pp. 689-692, 1994.
2. S. Sokolov M. and A. S. Treskunov, "Automatic vision system for final test of liquid crystal displays," IEEE International Conference on Robotics and Automation, Vol. 12, pp. 1579-1582, 1992.
3. Jae Y. Lee and Suk I. Yoo, "Automatic detection of region-mura defect in TFT-LCD," IEICE Transactions on Information and Systems, Vol.E87-D, No. 10, pp.2371-2378, 2004.
4. B. C. Jiang, C. C. Wang, and H. C. Liu, "Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques," International Journal of Production Research, Vol.43, No.1, pp.67-80, 2005.
5. C. J. Lu and D. M. Tsai, "Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition," International Journal of Production Research, Vol.42, No.20, pp.4331-4351, 2004.
6. Chi-Jie Lu and Du-Ming Tsai, "Automatic defect inspection for LCDs using singular value decomposition," International Journal of Advanced Manufacturing Technology, Vol.25, pp.53-61, 2005.
7. C. Lowry A. and D. C. Montgomery, "A review of multivariate control charts," HE Transactions, 27, pp. 800-810, 1995.
8. 2 Statistic to Batch Process," Journal of Quality Technology, Vol. 33, No. 4, pp. 466-479, 2001.
9. rd Edition, pp. 491-504, 2005.
10. M. Dorigo, V. Maniezzo and A. Colorni, "Ant system: optimization by a colony of cooperating agents," IEEE Transactions on Systems, Man, and Cybernetics-Part B, Vol.26, No.1, pp.29-41, 1996.
11. M. Dorigo, E. Bonabeau and G. Theraulaz, "Ant algorithms and stigmergy," Future Generation Computer System, Vol.16, pp.851-871, 2000.
12. B. S. Kang, and S. C. Park, "Integrated machine learning approaches for complementing statistical process control procedures," Decision Support Systems, Vol. 29, Iss. 1, pp. 59-72, 2000.
13. G. C. Lalor and C. Zhang, "Multivariate outlier detection and remediation in geochemical databases," The Science of the Total Environment, Vol. 281, Iss. 1-3, pp. 99-109, 2001.
14. A. E. Smith, "X-bar and R control chart interpretation using neural computing," International Journal of Production Research, Vol.32, pp. 309-320, 1994.
15. D. R. Hush, and B. G. Home, "Progress in supervised neural networks," IEEE Signal Processing Magazine, January, pp. 8-39, 1993.
16. N. Otsu, "A threshold selection method from gray level histograms," IEEE Transactions on Systems, Man and Cybernetics, Vol.SMC-9, pp.62-66, 1979.