Structure-property-processing relationships of single-wall carbon nanotube thin film piezoresistive sensors

Carbon

Volumn 59, Issue , 2013, Pages 315-324

  Luo, Sida ^a   Liu, Tao ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXCLUDED VOLUME; GAUGE FACTORS; PIEZO-RESISTIVE BEHAVIOR; PIEZO-RESISTIVE SENSORS; TENSILE DEFORMATION;

DEFORMATION; GAGES; SENSORS; THIN FILMS;

FILM THICKNESS;

EID: 84877692592     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2013.03.024     Document Type: Article

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