High spatial resolution electron energy loss spectroscopy and imaging in an aberration corrected STEM

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 3, 2003, Pages 40-41

  Bleloch, A ^a   Falke, U ^a   Falke, M ^a  

^a DARESBURY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142060729     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603012029     Document Type: Conference Paper

References (1)

1. O. L. Krivanek, N. Delby and A. R. Lupini, Ultramicroscopy 78(1999)1-11