An integrated silicon drift detector system for FEI Schottky field emission transmission electron microscopes

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 208-209

  Von Harrach, H S ^a   Dona, P ^a   Freitag, B ^a   Soltau, H ^b   Niculae, A ^b   Rohde, M ^c  

^a Thermo Fisher Scientific   (United States)

^b PNSENSOR GMBH   (Germany)

^c BRUKER AXS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949137809     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094288     Document Type: Article

References (3)

1. E. Gatti and P. Rehak, Nucl. Instrum. Methods A 225 (1984) 608
2. B. Freitag et al., Microsc. Microanal. 14 (Suppl.2) (2008) 1370.
3. T.O. Ziebold, Anal. Chem. 39 (1967) 859