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Advanced Materials

Volumn 25, Issue 18, 2013, Pages 2562-2566

Structural and optoelectronic characterization of RF sputtered ZnSnN 2

(6) Lahourcade, Lise a Coronel, Naomi C a Delaney, Kris T b Shukla, Sujeet K c Spaldin, Nicola A d Atwater, Harry A a,e

a California Institute of Technology (United States)

b UNIVERSITY OF CALIFORNIA (United States)

c CALIFORNIA INSTITUTE OF TECHNOLOGY (United States)

d ETH ZURICH (Switzerland)

e CALIFORNIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

energy materials; materials science; semiconductors; thin films

Indexed keywords

BURSTEIN-MOSS EFFECTS; ENERGY MATERIALS; OPTICAL MEASUREMENT; OPTOELECTRONIC CHARACTERIZATION; PHOTOVOLTAIC ABSORBERS; SPUTTERED THIN FILMS;

MATERIALS SCIENCE; OPTICAL DATA PROCESSING; SEMICONDUCTOR MATERIALS; THIN FILMS;

ENERGY GAP;

EID: 84877307886 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201204718 Document Type: Article

Times cited : (184)

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