-
1
-
-
7444220645
-
Electric field in atomically thin carbon films
-
DOI 10.1126/science.1102896
-
K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A. Firsov, Science 306, 666 (2004). 10.1126/science.1102896 (Pubitemid 39440910)
-
(2004)
Science
, vol.306
, Issue.5696
, pp. 666-669
-
-
Novoselov, K.S.1
Geim, A.K.2
Morozov, S.V.3
Jiang, D.4
Zhang, Y.5
Dubonos, S.V.6
Grigorieva, I.V.7
Firsov, A.A.8
-
2
-
-
77956430820
-
-
10.1038/nnano.2010.132
-
S. Bae, H. Kim, Y. Lee, X. Xu, J.-S. Park, Y. Zheng, J. Balakrishnan, T. Lei, H. R. Kim, Y. I. Song, Y.-J. Kim, K. S. Kim, B. Özyilmaz, J.-H. Ahn, B. H. Hong, and S. Iijima, Nat. Nanotechnol. 5, 574 (2010). 10.1038/nnano.2010. 132
-
(2010)
Nat. Nanotechnol.
, vol.5
, pp. 574
-
-
Bae, S.1
Kim, H.2
Lee, Y.3
Xu, X.4
Park, J.-S.5
Zheng, Y.6
Balakrishnan, J.7
Lei, T.8
Kim, H.R.9
Song, Y.I.10
Kim, Y.-J.11
Kim, K.S.12
Özyilmaz, B.13
Ahn, J.-H.14
Hong, B.H.15
Iijima, S.16
-
3
-
-
76249106631
-
-
10.1126/science.1184289
-
Y.-M. Lin, C. Dimitrakopoulos, K. A. Jenkins, D. B. Farmer, H.-Y. Chiu, A. Grill, and P. Avouris, Science 327, 662 (2010). 10.1126/science.1184289
-
(2010)
Science
, vol.327
, pp. 662
-
-
Lin, Y.-M.1
Dimitrakopoulos, C.2
Jenkins, K.A.3
Farmer, D.B.4
Chiu, H.-Y.5
Grill, A.6
Avouris, P.7
-
5
-
-
47749150628
-
Measurement of the elastic properties and intrinsic strength of monolayer graphene
-
DOI 10.1126/science.1157996
-
C. Lee, X. Wei, J. W. Kysar, and J. Hone, Science 321, 385 (2008). 10.1126/science.1157996 (Pubitemid 352029970)
-
(2008)
Science
, vol.321
, Issue.5887
, pp. 385-388
-
-
Lee, C.1
Wei, X.2
Kysar, J.W.3
Hone, J.4
-
6
-
-
41849125958
-
2
-
DOI 10.1038/nnano.2008.58, PII NNANO200858
-
J.-H. Chen, C. Jang, S. Xiao, M. Ishigami, and M. S. Fuhrer, Nat. Nanotechnol. 3, 206 (2008). 10.1038/nnano.2008.58 (Pubitemid 351499398)
-
(2008)
Nature Nanotechnology
, vol.3
, Issue.4
, pp. 206-209
-
-
Chen, J.-H.1
Jang, C.2
Xiao, S.3
Ishigami, M.4
Fuhrer, M.S.5
-
7
-
-
59649099717
-
-
10.1038/nature07719
-
K. S. Kim, Y. Zhao, H. Jang, S. Y. Lee, J. M. Kim, K. S. Kim, J.-H. Ahn, P. Kim, J.-Y. Choi, and B. H. Hong, Nature (London) 457, 706 (2009). 10.1038/nature07719
-
(2009)
Nature (London)
, vol.457
, pp. 706
-
-
Kim, K.S.1
Zhao, Y.2
Jang, H.3
Lee, S.Y.4
Kim, J.M.5
Kim, K.S.6
Ahn, J.-H.7
Kim, P.8
Choi, J.-Y.9
Hong, B.H.10
-
8
-
-
76749100296
-
-
10.1021/nl903272n
-
Y. Lee, S. Bae, H. Jang, S. Jang, S.-E. Zhu, S. H. Sim, Y. I. Song, B. H. Hong, and J.-H. Ahn, Nano Lett. 10, 490 (2010). 10.1021/nl903272n
-
(2010)
Nano Lett.
, vol.10
, pp. 490
-
-
Lee, Y.1
Bae, S.2
Jang, H.3
Jang, S.4
Zhu, S.-E.5
Sim, S.H.6
Song, Y.I.7
Hong, B.H.8
Ahn, J.-H.9
-
9
-
-
64149103117
-
-
10.1109/JPROC.2009.2013612
-
A. A. Barlian, W. Park, J. R. Mallon, Jr., A. J. Rastegar, and B. L. Pruitt, Proc. IEEE 97, 513 (2009). 10.1109/JPROC.2009.2013612
-
(2009)
Proc. IEEE
, vol.97
, pp. 513
-
-
Barlian, A.A.1
Park, W.2
Mallon, Jr.J.R.3
Rastegar, A.J.4
Pruitt, B.L.5
-
10
-
-
84868109917
-
-
10.1016/j.carbon.2012.08.048
-
S.-H. Bae, Y. Lee, B. K. Sharma, H.-J. Lee, J.-H. Kim, and J.-H. Ahn, Carbon 51, 236 (2013). 10.1016/j.carbon.2012.08.048
-
(2013)
Carbon
, vol.51
, pp. 236
-
-
Bae, S.-H.1
Lee, Y.2
Sharma, B.K.3
Lee, H.-J.4
Kim, J.-H.5
Ahn, J.-H.6
-
11
-
-
79961145505
-
-
10.1021/nn103523t
-
Y. Wang, R. Yang, Z. Shi, L. Zhang, D. Shi, E. Wang, and G. Zhang, ACS Nano 5, 3645 (2011). 10.1021/nn103523t
-
(2011)
ACS Nano
, vol.5
, pp. 3645
-
-
Wang, Y.1
Yang, R.2
Shi, Z.3
Zhang, L.4
Shi, D.5
Wang, E.6
Zhang, G.7
-
12
-
-
79952605050
-
-
10.1021/nl104227t
-
M. Huang, T. A. Pascal, H. Kim, W. A. Goddard, and J. R. Greer, Nano Lett. 11, 1241 (2011). 10.1021/nl104227t
-
(2011)
Nano Lett.
, vol.11
, pp. 1241
-
-
Huang, M.1
Pascal, T.A.2
Kim, H.3
Goddard, W.A.4
Greer, J.R.5
-
13
-
-
79952592644
-
-
10.1021/nl103618e
-
S.-E. Zhu, R. Shabani, J. Rho, Y. Kim, B. H. Hong, J.-H. Ahn, and H. J. Cho, Nano Lett. 11, 977 (2011). 10.1021/nl103618e
-
(2011)
Nano Lett.
, vol.11
, pp. 977
-
-
Zhu, S.-E.1
Shabani, R.2
Rho, J.3
Kim, Y.4
Hong, B.H.5
Ahn, J.-H.6
Cho, H.J.7
-
14
-
-
84876977619
-
-
material at E-APPLAB-102-054317 for device fabrication and characterisation
-
See supplementary material at http://dx.doi.org/10.1063/1.4802799 E-APPLAB-102-054317 for device fabrication and characterisation.
-
, Issue.SUPPL.
-
-
-
16
-
-
77950595773
-
-
10.1109/JMEMS.2010.2041190
-
J. F. Creemer, S. Helveg, P. J. Kooyman, A. M. Molenbroek, H. W. Zandbergen, and P. M. Sarro, J. Microelectromech. Syst. 19, 254 (2010). 10.1109/JMEMS.2010.2041190
-
(2010)
J. Microelectromech. Syst.
, vol.19
, pp. 254
-
-
Creemer, J.F.1
Helveg, S.2
Kooyman, P.J.3
Molenbroek, A.M.4
Zandbergen, H.W.5
Sarro, P.M.6
-
17
-
-
5544274244
-
-
10.1063/1.98460
-
M. G. Allen, M. Mehregany, R. T. Howe, and S. D. Senturia, Appl. Phys. Lett. 51, 241 (1987). 10.1063/1.98460
-
(1987)
Appl. Phys. Lett.
, vol.51
, pp. 241
-
-
Allen, M.G.1
Mehregany, M.2
Howe, R.T.3
Senturia, S.D.4
-
19
-
-
67349267819
-
-
10.1016/j.mee.2009.03.113
-
K. B. Gavan, H. J. R. Westra, E. W. J. M. Van der Drift, W. J. Venstra, and H. S. J. Van der Zant, Microelectron. Eng. 86, 1216 (2009). 10.1016/j.mee.2009.03.113
-
(2009)
Microelectron. Eng.
, vol.86
, pp. 1216
-
-
Gavan, K.B.1
Westra, H.J.R.2
Van Der Drift, E.W.J.M.3
Venstra, W.J.4
Van Der Zant, H.S.J.5
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