Short range order and stability of amorphous GexTe 100-x alloys (12 ≤ x ≤ 44.6)

Journal of Physics Condensed Matter

Volumn 25, Issue 19, 2013, Pages

  Jovari P ^a   Piarristeguy, A ^b   Escalier, R ^b   Kaban, I ^c,d   Bednarcik J ^e   Pradel, A ^b  

^a WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

^b UNIVERSITÉ DE MONTPELLIER   (France)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^d IFW DRESDEN   (Germany)

^e DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SHORT-RANGE ORDER; COMPOSITION DEPENDENCE; COMPOSITION RANGES; EXTENDED X-RAY ABSORPTION FINE STRUCTURE MEASUREMENTS; RANDOM COVALENT NETWORKS; REVERSE MONTE CARLO SIMULATION; SHORT RANGE ORDERS; THERMAL CO-EVAPORATION;

AMORPHOUS ALLOYS; AMORPHOUS FILMS; CHEMICAL BONDS; CHEMICAL STABILITY; COMPUTER SIMULATION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; GLASS; MONTE CARLO METHODS; THERMAL EVAPORATION; X RAY DIFFRACTION;

GERMANIUM;

ALLOY; GERMANIUM; TELLURIUM;

ARTICLE; CHEMISTRY; HARDNESS; HEAT; MATERIALS TESTING; PARTICLE SIZE; PHASE TRANSITION; SURFACE PROPERTY; TRANSITION TEMPERATURE;

ALLOYS; GERMANIUM; HARDNESS; HOT TEMPERATURE; MATERIALS TESTING; PARTICLE SIZE; PHASE TRANSITION; SURFACE PROPERTIES; TELLURIUM; TRANSITION TEMPERATURE;

EID: 84876945769     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/25/19/195401     Document Type: Article

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