Structure of Asx Te100-x (20≤x≤60) glasses investigated with x-ray absorption fine structure, x-ray and neutron diffraction, and reverse Monte Carlo simulation

Journal of Chemical Physics

Volumn 129, Issue 21, 2008, Pages

  Jovari P ^a   Yannopoulos, S N ^b   Kaban, I ^c   Kalampounias, A ^b   Lishchynskyy, I ^d   Beuneu, B ^e   Kostadinova, O ^b   Welter, E ^f   Schops A ^f  

^a WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

^b INSTITUTE OF CHEMICAL ENGINEERING SCIENCES   (Greece)

^c CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^d VASYL STEFANYK PRECARPATHIAN NATIONAL UNIVERSITY   (Ukraine)

^e CEA SACLAY   (France)

^f DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; AMORPHOUS ALLOYS; AMORPHOUS SILICON; ARSENIC; ATOMIC PHYSICS; ATOMS; BINARY ALLOYS; CHEMICAL ANALYSIS; DIFFRACTION; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; GERMANIUM; GLASS; GLASS BONDING; METALLIC COMPOUNDS; MONTE CARLO METHODS; NEUTRON DIFFRACTION; SILICON; X RAY ABSORPTION; X RAY DIFFRACTION;

ABSORPTION FINE STRUCTURES; ARSENIC ATOMS; AVERAGE NUMBERS; CHEMICAL ORDERINGS; CONCENTRATION DEPENDENCES; CONCENTRATION REGIONS; COORDINATION NUMBERS; DATA SETS; HIGH ENERGIES; HOMONUCLEAR; MONOTONICALLY; PHYSICO-CHEMICAL PROPERTIES; PROBING TECHNIQUES; REVERSE MONTE CARLO SIMULATIONS; STOICHIOMETRIC COMPOSITIONS; STRUCTURAL DETAILS; X-RAY DIFFRACTIONS;

TELLURIUM COMPOUNDS;

EID: 57349103344     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3026591     Document Type: Article

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