Structure of Te-rich Te-Ge-X (X = I, Se, Ga) glasses

Journal of Physics Condensed Matter

Volumn 22, Issue 40, 2010, Pages

  Jóvári, Pál ^a   Kaban, Ivan ^b   Bureau, Bruno ^c   Wilhelm, Allison ^c,d   Lucas, Pierre ^d   Beuneu, Brigitte ^e   Zajac, Dariusz A ^f  

^a WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

^b IFW DRESDEN   (Germany)

^c INSTITUT DES SCIENCES CHIMIQUES DE RENNES   (France)

^d University of Arizona   (United States)

^e CEA SACLAY   (France)

^f DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COORDINATION NUMBER; COVALENT NETWORK; EXPERIMENTAL DATA; EXTENDED X-RAY ABSORPTION FINE STRUCTURE DATUM; EXTENDED X-RAY ABSORPTION FINE STRUCTURE MEASUREMENTS; FAR INFRARED; PROMISING MATERIALS; REVERSE MONTE CARLO SIMULATION; SHORT RANGE ORDERS; STRUCTURAL UNIT; THIRD COMPONENT; X-RAY AND NEUTRON DIFFRACTION; X-RAY DIFFRACTION MEASUREMENTS;

ABSORPTION; ABSORPTION SPECTRA; BOND LENGTH; COMPUTER SIMULATION; GALLIUM; GERMANIUM; GLASS; MONTE CARLO METHODS; NEUTRON DIFFRACTION; SEMICONDUCTING SELENIUM COMPOUNDS; X RAY ABSORPTION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

TELLURIUM COMPOUNDS;

GALLIUM; GERMANIUM; GLASS; INDIUM; IODINE; SELENIUM; TELLURIUM;

ARTICLE; CHEMISTRY; NEUTRON DIFFRACTION;

GALLIUM; GERMANIUM; GLASS; INDIUM; IODINE; NEUTRON DIFFRACTION; SELENIUM; TELLURIUM;

EID: 78149434634     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/40/404207     Document Type: Article

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