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Volumn 356, Issue 41-42, 2010, Pages 2175-2180
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Effect of composition on the properties of Te-Ge thick films deposited by co-thermal evaporation
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Author keywords
Co thermal evaporation; Film characterisation; Infrared transmitting materials; Telluride thick films
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Indexed keywords
BULK GLASS;
CO-THERMAL EVAPORATION;
DARWIN MISSION;
DSC CURVES;
ELEMENTAL POWDERS;
EUROPEAN SPACE AGENCY;
FAR-INFRARED REGIONS;
GLASS TRANSITION TEMPERATURE;
HOMOGENEOUS FILMS;
INFRARED APPLICATIONS;
INFRARED TRANSMITTING MATERIAL;
M-LINES;
MICRO-COMPONENTS;
MICROHARDNESS MEASUREMENT;
MICROSCOPE SLIDE;
REFRACTIVE INDEX MEASUREMENT;
TELLURIDE THICK FILMS;
THERMAL PROPERTIES;
TWO STAGE;
COBALT;
CRYSTALLIZATION;
GERMANIUM;
GLASS;
GLASS TRANSITION;
LIGHT REFRACTION;
MICROHARDNESS;
REFRACTIVE INDEX;
REFRACTOMETERS;
SUBSTRATES;
TELLURIUM;
TELLURIUM COMPOUNDS;
THERMODYNAMIC PROPERTIES;
THICK FILMS;
VAPOR DEPOSITION;
THERMAL EVAPORATION;
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EID: 77957142009
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2010.08.004 Document Type: Article |
Times cited : (20)
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References (24)
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