Selenide and telluride thick films for mid and thermal infrared applications

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 5, 2005, Pages 2625-2634

  Vigreux Bercovici, C ^a   Labadie, L ^b   Broquin, J E ^c   Kern, P ^b   Pradel, A ^a  

^a UNIVERSITÉ DE MONTPELLIER   (France)

^b LABORATOIRE D ASTROPHYSIQUE   (France)

^c Grenoble INP Phelma   (France)

Author keywords

m lines measurements; Optical Characterisation; RF Sputtering; Selenide and telluride thick films; Thermal evaporation; Thermal infrared waveguides

Indexed keywords

ADHESIVES; GLASS; INFRARED RADIATION; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SELENIUM COMPOUNDS; SUBSTRATES; TELLURIUM COMPOUNDS; THERMAL EVAPORATION; THICK FILMS;

M-LINES; OPTICAL CHARACTERISATION; RF-SPUTTERING; SELENIDES; THERMAL INFRARED;

ARSENIC COMPOUNDS;

EID: 27844470604     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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