Sensitivity of extended X-ray-absorption fine structure to thermal expansion

Physical Review Letters

Volumn 82, Issue 21, 1999, Pages 4240-4243

  Dalba, G ^a,b   Fornasini, P ^a,b   Grisenti, R ^a,b   Purans, J ^a,b,c  

^a UNIVERSITY OF TRENTO   (Italy)

^b INFM   (Italy)

^c UNIVERSITY OF LATVIA   (Latvia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243747869     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.82.4240     Document Type: Article

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