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Volumn , Issue , 2007, Pages 758-763

Manufacture and characterization of a novel flip-chip package Z-interconnect stack-up with RF structures

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CHARACTERIZATION; GROUND SIGNAL GROUNDS; INTEGRATED APPROACH; MATERIALS DEVELOPMENT; POLYPHENYLENE ETHERS; POLYTETRAFLUOROETHYLENE (PTFE); S-PARAMETER MEASUREMENTS; SMALL-DIAMETER HOLES;

EID: 84876939347     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.