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Volumn 2006, Issue , 2006, Pages 112-118

Electrical conductivity and reliability of nano- and micro-filled conducting adhesives for Z-axis interconnections

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ADHESIVES; DIE PAD PITCH; PRESSURE LAMINATION;

EID: 33845564203     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2006.1645633     Document Type: Conference Paper
Times cited : (29)

References (8)
  • 1
    • 0003512080 scopus 로고    scopus 로고
    • 1999 (British Isles: Electrochemical Publications Ltd)
    • Liu, J., 1999, Conductive Adhesives for Electronics Packaging, (British Isles: Electrochemical Publications Ltd, 1999), pp. 317-320.
    • (1999) Conductive Adhesives for Electronics Packaging , pp. 317-320
    • Liu, J.1
  • 2
    • 0002822682 scopus 로고
    • High volume electronics manufacturing using conductive adhesives for surface mounting
    • 1995
    • Liu, J., Rorgren, R., and Ljungkrona, L., 1995, "High Volume Electronics Manufacturing Using Conductive Adhesives for Surface Mounting," J. Surf. Mount Technol., Vol. 8, No2 (1995), pp. 30-41.
    • (1995) J. Surf. Mount Technol. , vol.8 , Issue.2 , pp. 30-41
    • Liu, J.1    Rorgren, R.2    Ljungkrona, L.3
  • 3
    • 0033316027 scopus 로고    scopus 로고
    • Effect of Ag particle size on electrical conductivity of isotropically conductive adhesives
    • 1999
    • Ye, L., Lai, Z., Liu, J., and Tholen, A., 1999, "Effect of Ag Particle Size on Electrical Conductivity of Isotropically Conductive Adhesives," IEEE Trans. Electron, Packag., Manuf., Vol. 22,(1999), pp. 299-302.
    • (1999) IEEE Trans. Electron, Packag., Manuf. , vol.22 , pp. 299-302
    • Ye, L.1    Lai, Z.2    Liu, J.3    Tholen, A.4
  • 4
    • 2442496810 scopus 로고    scopus 로고
    • Joining mechanism and joint property by polymer adhesive with low melting alloy filler
    • Yasuda, K., Kim, J. M., Rito, M., and Fujimoto, K., "Joining Mechanism and Joint Property by Polymer Adhesive with Low Melting Alloy Filler," Int. Conf. on Electron. Packag., (2003),pp. 149-154.
    • (2003) Int. Conf. on Electron. Packag. , pp. 149-154
    • Yasuda, K.1    Kim, J.M.2    Rito, M.3    Fujimoto, K.4
  • 5
    • 18744407157 scopus 로고    scopus 로고
    • New process of self-organized interconnection in packaging by conductive adhesive with low melting point filler
    • Yasuda, K., Kim, J. M., Yasuda, M., and Fujimoto, K., "New Process of Self-Organized Interconnection in Packaging by Conductive Adhesive with Low Melting Point Filler," Int. Conf. on Solid State Devices and Materials,(2003),pp. 390-391.
    • (2003) Int. Conf. on Solid State Devices and Materials , pp. 390-391
    • Yasuda, K.1    Kim, J.M.2    Yasuda, M.3    Fujimoto, K.4
  • 7
    • 0040077814 scopus 로고    scopus 로고
    • Interfacial versus cohesive failure on polymer- metal interfaces in electronic packaging - Effects of interface roughness
    • 2002
    • Yao, Q., and Qu, J., 2002, "Interfacial versus Cohesive Failure on Polymer- Metal Interfaces in Electronic Packaging - Effects of Interface Roughness," ASME J. Electron. Packag., Vol.124 (2002), pp. 127-134.
    • (2002) ASME J. Electron. Packag. , vol.124 , pp. 127-134
    • Yao, Q.1    Qu, J.2
  • 8
    • 24644446471 scopus 로고    scopus 로고
    • Z-axis interconnection for enhanced wiring in organic laminate electronic packages
    • 2005 May 31 to June 3, 2005, Lake Buena Vista, FL (IEEE, Piscataway, NJ, USA)
    • Egitto, F.D., Krasniak, S.R., Blackwell, K.J., and Rosser, S.G., 2005, "Z-Axis Interconnection for Enhanced Wiring in Organic Laminate Electronic Packages," Proceedings Fifty-Fifth Electronic Components and Technology Conference, May 31 to June 3, 2005, Lake Buena Vista, FL (IEEE, Piscataway, NJ, USA),(2005), pp. 1132-1138.
    • (2005) Proceedings Fifty-fifth Electronic Components and Technology Conference , pp. 1132-1138
    • Egitto, F.D.1    Krasniak, S.R.2    Blackwell, K.J.3    Rosser, S.G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.