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Volumn 37, Issue 3, 2013, Pages 658-670

Sensitivity analysis of nanoparticles pushing manipulation by AFM in a robust controlled process

Author keywords

Atomic force microscope; Dynamic friction; Nanomanipulation; Piezoelectric actuator; Sensitivity analysis; Sliding mode control

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); DESIRED TRAJECTORIES; DYNAMIC FRICTION; MICRO/NANOMANIPULATION; NANOMANIPULATIONS; NANOPARTICLE MANIPULATION; PIEZOELECTRIC SUBSTRATES; REAL TIME VISUALIZATION;

EID: 84876667197     PISSN: 01416359     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.precisioneng.2013.01.011     Document Type: Article
Times cited : (46)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.