Automatic drift compensation using phase correlation method for nanomanipulation

IEEE Transactions on Nanotechnology

Volumn 7, Issue 2, 2008, Pages 209-216

  Yang, Qinmin ^a,b   Jagannathan, S ^a,b   Bohannan, E W ^c  

^a IEEE

^b Missouri University of Science and Technology   (United States)

^c MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

Nanomanipulation; Neural network (NN); Phase correlation method; Scanning probe microscope; Thermal drift

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTROL EQUIPMENT; ERROR ANALYSIS; UNCERTAINTY ANALYSIS;

AUTOMATIC COMPENSATION; NANOMANIPULATION; PHASE CORRELATION METHODS; THERMAL DRIFTS;

NEURAL NETWORKS;

EID: 41149103845     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2007.915021     Document Type: Conference Paper

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