Sensitivity analysis of nanoparticles pushing critical conditions in 2-D controlled nanomanipulation based on AFM

International Journal of Advanced Manufacturing Technology

Volumn 41, Issue 7-8, 2009, Pages 714-726

  Korayem, M H ^a   Zakeri, M ^a  

^a IRAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Iran)

Author keywords

AFM; Dynamic; Nanoparticles; Pushing; Sensitivity; Simulation

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DATA VISUALIZATION; MEDICAL IMAGING; MICROMANIPULATORS; NANOTECHNOLOGY; SENSITIVITY ANALYSIS; SLIP FORMING; SUBSTRATES;

AFM; AFM CANTILEVERS; AFM-BASED NANOMANIPULATION; CONTACT MECHANICS; CRITICAL CONDITIONS; CRITICAL FORCES; CRITICAL PARAMETERS; CRITICAL TIME; DYNAMIC EQUATIONS; DYNAMIC SIMULATIONS; FORCE DATUM; FREE BODY DIAGRAMS; GOLD PARTICLES; INITIAL CONDITIONS; JOHNSON-KENDALL-ROBERTS; NANO MANIPULATIONS; NORMAL FRICTIONS; NUMERICAL SIMULATIONS; PARTICLE PUSHING; PULL-OFF FORCES; PUSHING; PUSHING FORCES; REAL-TIME VISUALIZATIONS; SENSITIVITY; SILICON SUBSTRATES; SIMULATION; STICK SLIPS;

NANOPARTICLES;

EID: 62349096292     PISSN: 02683768     EISSN: 14333015     Source Type: Journal    
DOI: 10.1007/s00170-008-1519-0     Document Type: Article

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