CMOS scaling and issues in sub-0.25 μm systems

Design of High-Performance Microprocessor Circuits

Volumn , Issue , 2000, Pages 27-45

  Taur, Yuan ^a  

^a IBM   (United States)

Author keywords

CMOS integrated circuits; Insulators; Logic gates; MOSFET circuits; Silicon; Threshold voltage; Voltage control

Indexed keywords

ELECTRIC INSULATORS; LOGIC GATES; SILICON; THRESHOLD VOLTAGE; VOLTAGE CONTROL;

CMOS SCALING; MOSFET CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 84876551598     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1109/9780470544365.ch2     Document Type: Chapter

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