Displacement damage in Tio2 Memristor devices

IEEE Transactions on Nuclear Science

Volumn 60, Issue 2, 2013, Pages 1379-1383

  Deionno, E ^a   Looper, M D ^a   Osborn, J V ^a   Palko, J W ^b  

^a AEROSPACE CORPORATION   (United States)

^b JWP Solar Research   (United States)

Author keywords

Displacement damage; memristor; neutrons; protons; RRAM; TiO2

Indexed keywords

DISPLACEMENT DAMAGES; FLUENCES; MEMRISTOR; RADIATION-HARDENED; RRAM; TEST DEVICE; TIO;

MEMRISTORS; NEUTRONS; PASSIVE FILTERS; PROTONS; RANDOM ACCESS STORAGE; RESISTORS; TITANIUM DIOXIDE;

NEUTRON IRRADIATION;

EID: 84876270195     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2013.2249529     Document Type: Article

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