Micro-focusing of hard X-ray free electron laser radiation using Kirkpatrick-Baez mirror system

Journal of Physics: Conference Series

Volumn 425, Issue PART 5, 2013, Pages

  Yumoto, H ^a   Mimura, H ^b   Matsuyama, S ^c   Koyama, T ^a   Hachisu, Y ^d   Kimura, T ^e   Yokoyama, H ^c   Kim, J ^c   Sano, Y ^c   Tono, K ^a   Togashi, T ^a   Inubushi, Y ^f   Sato, T ^f   Tanaka, T ^f   Yabashi, M ^f   Ohashi, H ^a,f   Ohmori, H ^d   Ishikawa, T ^f   Yamauchi, K ^c  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c OSAKA UNIVERSITY   (Japan)

^d RIKEN   (Japan)

^e HOKKAIDO UNIVERSITY   (Japan)

^f RIKEN SPring 8 Center ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; FOCUSING; FREE ELECTRON LASERS; LASER RADIATION; MIRRORS; SYNCHROTRON RADIATION; SYNCHROTRONS;

FOCUSING MIRRORS; FOCUSING PROPERTIES; KIRKPATRICK-BAEZ MIRROR; POWER DENSITIES; PRECISE ALIGNMENTS; SCANNING METHODS; ULTRA PRECISION; X-RAY FREE ELECTRON LASERS;

LASER MIRRORS;

EID: 84876269125     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/425/5/052022     Document Type: Conference Paper

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