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Volumn 195, Issue , 2013, Pages 133-138

Piezoresistive sensors for force mapping of hip-prostheses

Author keywords

Low temperature poly Si; Nanocrystalline Si; Piezoresistive poly Si; Prosthesis monitoring; Stress mapping

Indexed keywords

LOW TEMPERATURE POLY-SI; MONITORING PERFORMANCE; NANOCRYSTALLINE SI; PIEZO-RESISTIVE; PIEZO-RESISTIVE SENSORS; PROSTHETIC COMPONENTS; STRAIN GAUGE SENSORS; STRESS-STRAIN EXPERIMENTS; VIBRATION FREQUENCY;

EID: 84876230503     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2013.03.013     Document Type: Article
Times cited : (11)

References (15)
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  • 2
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  • 5
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    • DOI 10.1016/S1350-4533(00)00068-0, PII S1350453300000680
    • L. Cristofolini, A. Marchetti, A. Cappello, and M. Viceconti A novel transducer for the measurement of cement-prosthesis interface forces in cemented orthopaedic devices Medical Engineering and Physics 22 2000 493 501 (Pubitemid 32112674)
    • (2000) Medical Engineering and Physics , vol.22 , Issue.7 , pp. 493-501
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  • 6
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  • 10
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    • DOI 10.1016/S1350-4533(96)00060-4
    • D.W. Bühler, T.R. Oxland, and L.P. Nolte Design and evaluation of a device for measuring three-dimensional micromotions of press-fit femoral stem prostheses Medical Engineering and Physics 19 1997 187 199 (Pubitemid 27235227)
    • (1997) Medical Engineering and Physics , vol.19 , Issue.2 , pp. 187-199
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  • 11
    • 43849104628 scopus 로고    scopus 로고
    • Diagnostic of silicon piezoresistive pressure sensors by low frequency noise measurements
    • DOI 10.1016/j.sna.2008.02.002, PII S0924424708000976
    • M.M. Jevtić, and M.A. Smiljanić Diagnostic of silicon piezoresistive pressure sensors by low frequency noise measurements Sensors and Actuators A: Physical 144 2008 267 274 (Pubitemid 351695476)
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  • 13
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    • Implants for surgery - Partial and total hip joint prostheses
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  • 14
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    • Ultra-sensitive shape sensor test structures based on piezoresistive doped nanocrystalline silicon
    • P. Alpuim, E.S. Marins, P.F. Rocha, I.G. Trindade, M.A. Carvalho, and S. Lanceros-Mendez Ultra-sensitive shape sensor test structures based on piezoresistive doped nanocrystalline silicon Vacuum 83 2009 1279 1282
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.