Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

Beilstein Journal of Nanotechnology

Volumn 4, Issue 1, 2013, Pages 32-44

  Lübbe, Jannis ^a   Temmen, Matthias ^a   Rode, Sebastian ^b,c   Rahe, Philipp ^b,d   Kühnle, Angelika ^b   Reichling, Michael ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

^c SmarAct GmbH   (Germany)

^d UNIVERSITY OF UTAH   (United States)

Author keywords

Cantilever; Feedback loop; Filter; Noise; Noncontact atomic force microscopy (NC AFM)

Indexed keywords

CANTILEVER; FEED-BACK LOOP; FILTER; NOISE; NONCONTACT ATOMIC FORCE MICROSCOPY;

NANOCANTILEVERS; SIGNAL DETECTION; THERMAL NOISE; TRANSFER FUNCTIONS;

ATOMIC FORCE MICROSCOPY;

EID: 84876137646     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.4.4     Document Type: Article

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