Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy

Measurement Science and Technology

Volumn 21, Issue 12, 2010, Pages

  Lübbe, Jannis ^a   Tröger, Lutz ^a   Torbrügge, Stefan ^a,d   Bechstein, Ralf ^a,e   Richter, Christoph ^b   Kühnle, Angelika ^c   Reichling, Michael ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

^b NANOWORLD SERVICES GMBH   (Germany)

^c JOHANNES GUTENBERG UNIVERSITY   (Germany)

^d SPECS SURFACE NANO ANALYSIS GMBH   (Germany)

^e AARHUS UNIVERSITY   (Denmark)

Author keywords

Cantilever; Force microscopy; Mounting loss; NC AFM; Q factor

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS; ULTRAHIGH VACUUM;

CANTILEVER; DYNAMIC FORCE MICROSCOPY; FIGURES OF MERITS; FORCE MICROSCOPY; NON-CONTACT; Q-FACTORS; ROOM-TEMPERATURE OPERATION;

Q FACTOR MEASUREMENT;

EID: 78649842929     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/21/12/125501     Document Type: Article

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