-
2
-
-
38049120305
-
Extracting a simplified view of design functionality based on vector simulation
-
LNCS
-
Onur Guzey, et. al. Extracting a Simplified View of Design Functionality Based on Vector Simulation. Lecture Note in Computer Science, LNCS, Vol 4383, 2007, pp. 34-49.
-
(2007)
Lecture Note in Computer Science
, vol.4383
, pp. 34-49
-
-
Guzey, O.1
-
3
-
-
0003408420
-
-
The MIT Press
-
Bernhard Schölkopf, and Alexander J. Smola. Learning with Kernels: Support Vector Machines, Regularization, Optimization, and Beyond. The MIT Press, 2001.
-
(2001)
Learning with Kernels: Support Vector Machines, Regularization, Optimization, and Beyond
-
-
Schölkopf, B.1
Smola, A.J.2
-
4
-
-
84925740795
-
Rule induction for subgroup discovery with CN2-SD
-
Dec.
-
N. Lavrač, B. Kavšek, P. Flach, and L. Todorovski. Rule induction for subgroup discovery with CN2-SD Journal of Machine Learning Research, 5:153-188, Dec. 2004.
-
(2004)
Journal of Machine Learning Research
, vol.5
, pp. 153-188
-
-
Lavrač, N.1
Kavšek, B.2
Flach, P.3
Todorovski, L.4
-
5
-
-
84875854473
-
Novel test detection to improve simulation efficiency A commercial experiment
-
Wen Chen, et. al. Novel Test Detection to Improve Simulation Efficiency A Commercial Experiment. ACM/IEEE ICCAD, 2012.
-
(2012)
ACM/IEEE ICCAD
-
-
Chen, W.1
-
6
-
-
84881355324
-
Novel test analysis to improve structural coverage A commercial experiment
-
Wen Chen, et. al. Novel Test Analysis to Improve Structural Coverage A Commercial Experiment. IEEE VLSI Design Automation and Test Symposium, 2013.
-
(2013)
IEEE VLSI Design Automation and Test Symposium
-
-
Chen, W.1
-
7
-
-
77951222948
-
Data learning based diagnosis
-
Li-C. Wang, Data Learning Based Diagnosis. ASP-DAC, 2010, pp 247-254.
-
(2010)
ASP-DAC
, pp. 247-254
-
-
Wang, L.-C.1
-
8
-
-
70350736254
-
Predicting variability in nanoscale lithography processes
-
Dragoljub (Gagi) Drmanac, Frank Liu, Li-C. Wang. Predicting Variability in Nanoscale Lithography Processes. ACM/IEEE DAC, 2009, pp. 545-550.
-
(2009)
ACM/IEEE DAC
, pp. 545-550
-
-
Drmanac, D.1
Liu, F.2
Wang, L.-C.3
-
9
-
-
51549088664
-
Speedpath prediction based on learning from a small set of examples
-
June
-
Pouria Bastani, et. al. Speedpath Prediction Based on Learning from a Small Set of Examples. ACM/IEEE DAC, June 2008, pp. 217-222.
-
(2008)
ACM/IEEE DAC
, pp. 217-222
-
-
Bastani, P.1
-
10
-
-
84875847657
-
Feature based similarity search with application to speedpath analysis
-
Nicholas Callegari, Li-C. Wang, Pouria Bastani. Feature based similarity search with application to speedpath analysis. IEEE ITC, 2009.
-
(2009)
IEEE ITC
-
-
Callegari, N.1
Wang, L.-C.2
Bastani, P.3
-
11
-
-
34547355933
-
Design-silicon timing correlation - A data mining perspective
-
Li-C. Wang, Pouria Bastani, Magdy S. Abadir. Design-silicon timing correlation - a data mining perspective. In ACM/IEEE DAC 2007, pp. 384-389.
-
(2007)
ACM/IEEE DAC
, pp. 384-389
-
-
Wang, L.-C.1
Bastani, P.2
Abadir, M.S.3
-
12
-
-
51549086809
-
Statistical diagnosis of unmodeled timing effect
-
P. Bastani, et. al. Statistical Diagnosis of Unmodeled Timing Effect. ACM/IEEE DAC, 2008, pp. 355-360.
-
(2008)
ACM/IEEE DAC
, pp. 355-360
-
-
Bastani, P.1
-
13
-
-
77956200050
-
Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch
-
Nicholas Callegari, et. al. Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch. ACM/IEEE DAC, 2010, pp. 374-379.
-
(2010)
ACM/IEEE DAC
, pp. 374-379
-
-
Callegari, N.1
-
14
-
-
84875855714
-
Mining AC delay measurements for understanding speed-limiting paths
-
Janine Chen, et. al. Mining AC Delay Measurements for Understanding Speed-limiting Paths. IEEE ITC, 2010.
-
(2010)
IEEE ITC
-
-
Chen, J.1
-
15
-
-
84891519494
-
Screening customer ReturnsWith multivariate test analysis
-
Nik Sumikawa, et. al. Screening Customer ReturnsWith Multivariate Test Analysis. IEEE ITC, 2012.
-
(2012)
IEEE ITC
-
-
Sumikawa, N.1
-
16
-
-
79959515331
-
Important test selection for screening potential customer returns
-
Nik Sumikawa, et. al. Important Test Selection For Screening Potential Customer Returns. IEEE VLSI Design Automation and Test Symposium, 2011, pp. 171-174.
-
(2011)
IEEE VLSI Design Automation and Test Symposium
, pp. 171-174
-
-
Sumikawa, N.1
-
17
-
-
84875841126
-
An experiment of burn-in time reduction based on parametric test analysis
-
Nik Sumikawa, Li-C. Wang, and Magdy S. Abadir. An Experiment of Burn-In Time Reduction Based On Parametric Test Analysis. IEEE ITC, 2012.
-
(2012)
IEEE ITC
-
-
Sumikawa, N.1
Wang, L.-C.2
Abadir, M.S.3
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