Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch

Proceedings - Design Automation Conference

Volumn , Issue , 2010, Pages 374-379

  Callegari, Nicholas ^a   Drmanac, Dragoljub ^a   Wang, Li C ^a   Abadir, Magdy S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Freescale Semiconductors Inc   (United States)

Author keywords

Data mining; Delay test; Learning; Timing analysis

Indexed keywords

CLASSIFICATION RULES; CONTROLLED EXPERIMENT; CROSS-DOMAIN; DELAY TEST; DESIGN FEATURES; LEARNING; LEARNING APPROACH; MANUFACTURING PROCESS; MEASUREMENT DATA; MISMATCH PROBLEMS; POST-SILICON; RULE LEARNING ALGORITHMS; SUBGROUP DISCOVERY; TEST MEASUREMENTS; TIMING ANALYSIS;

COMPUTER SIMULATION; DATA MINING; INDUSTRIAL APPLICATIONS; LEARNING ALGORITHMS; TIME MEASUREMENT;

COMPUTER AIDED DESIGN;

EID: 77956200050     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1837274.1837368     Document Type: Conference Paper

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