Novel test analysis to improve structural coverage-A commercial experiment

2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013

Volumn , Issue , 2013, Pages

  Chen, Wen ^a,b   Wang, Li C ^b   Bhadra, Jayanta ^a   Abadir, Magdy S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL STUDIES; FEATURE-BASED; FUNCTIONAL VERIFICATION; LOAD STORE UNIT; LOW POWER PROCESSORS; SIMULATION ENVIRONMENT; TEST ANALYSIS; TEST GENERATIONS;

EXPERIMENTS; MICROPROCESSOR CHIPS;

TESTING;

EID: 84881355324     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLDI-DAT.2013.6533851     Document Type: Conference Paper

References (11)

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